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Tektronix Keithley Automated Characterization Suite (ACS) Software
ACS is a flexible, interactive software test environment designed for semiconductor device characterization, reliability test, parametric test, and component functional test. ACS supports a wide range of Keithley instrumentation, as well as Keithley's S500 and S530 systems. Exceptional testing and analysis flexibility and an intuitive GUI make novice users productive almost immediately.
- Intuitive GUI simplifies test plan development, test execution, and results analysis
- Develop and execute tests at the device, site, wafer, and cassette level
- Supports a wide range of instruments and system configurations including multi-SMU parallel test systems
- Full control of semi-automatic and fully-automatic probers
- Interactive and real-time data plotting
ACS Basic Edition is primarily for semiconductor component testing with manual probe stations or test fixtures. Perform initial device characterization quickly and interactively with Trace Mode. Or create detailed parameter extraction tests using the GUI-based set-up screen and extensive measurement libraries.