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Tektronix TLA6400 Logic Analyzer
The affordable TLA6400 Series of logic analyzers offer the performance needed to debug, validate, and optimize the functionality of your digital system. The TLA6400 Series also provides a comprehensive set ofsignal integritydebug tools that allow you quickly isolate, identify, and characterize elusive and hard-to-find problems. Add a broad range of support for today applications, and you have the ideal tool to help you meet all of the debug challenges of today digital designs.
| Features | Benefits |
| 40 ps Resolution | MagniVuacquisition mode enabled you to accurately see signal relationships in your system. |
| State Acquisition | Sample your fastest synchronous buses with clock rates up to 667 MHz and data rates up to 1333 Mb/s. |
| 15 in. Display | With the large display and optional touch screen, you can see more of your data and navigate efficiently through it. |
| 4 Models | Choose 34, 68, 102 or 136 channels and up to 64 Mb record length which offers flexible solutions to fit any budget. |
| Drag-and-Drop Triggering | Simply drag any one of eight different trigger types from a table onto the waveform and the logic analyzer will automatically set up the trigger conditions, eliminating errors, improving repeatability, and saving time. |
| Drag-and-Drop Measurements | Simply drag an icon from the measurement toolbar and drop it onto your signal of interest and get a table of results. Saves time, removes complexity, and reduces measurement uncertainty. |
| Glitch Trigger and Storage | Allows you to trigger on and highlight potential signal integrity problems. Not only can the TLA6400 Series trigger on the problem, but by highlighting suspected problems in red, you will be able to easily determine which signals you need to further investigate. |
| iCapture | Route the suspected signal to the analog output of the TLA6400 Series using the exclusive Tektronix iCapture feature. This eliminates the need to add an additional oscilloscope probe, minimizing potential loading issues and further reducing time to debug. |
| iView | Time-correlated view of both logic analyzer and oscilloscope data to trace the signal integrity problem across the digital and analog domains. |